STATISTICS WEEK AT ASU –
SPRING 2009
Our annual statistics week activities for spring 2009 will be held
Wednesday and Thursday, 4 and 5 March.
We will have two seminars by our statistics week visitor, Dr. David M. Steinberg
of
We are also pleased to have the participation of JMP this year. In addition to an exhibit during the
statistics fair, there will also be a presentation illustrating the new
features in the recent release of JMP (v8).
Dr. Bradley Jones, Director of Research & Development in the JMP division of SAS,
will give a presentation on choice experiments, one of the new capabilities of
JMP 8.
Seminar and
Statistics Fair Schedule
Wednesday,
4 March
“Sequential Bayesian Design of Experiments for Glm's” by Dr. David M. Steinberg
2:00 Refreshments
JMP Presentation and “Choice Experiments”, by Dr. Bradley Jones
Thursday,
5 March
1:30 pm GWC 487
“Sensitivity Analysis and Computer Experiments”, by Dr. David M. Steinberg
Abstracts and biographical information are at the end of this announcement.
Dr. Steinberg will be on campus on Monday and Tuesday 2 and 3 March and is available to meet with interested faculty on Monday and Tuesday afternoons. To schedule an appointment, please contact Theresa Chai in the Industrial, Systems and Operations Engineering Department, 5-3185.
SENSITIVITY ANALYSIS AND
COMPUTER EXPERIMENTS
David M. Steinberg
Department of Statistics and Operations Research
Scientific work is often carried out today on a computer screen rather than in the field or the laboratory. We study phenomena like the crash-worthiness of an automobile, the spread of pollutants from a waste dump or the anticipated performance of the national economy by running computer code that simulates the actual physics, biology or economics. These “computer experiments” have much common statistical ground with conventional laboratory experiments: we need to decide at what settings of the input factors to run the simulator and, having obtained output, to model its relationship to the factors. There are also differences – often there is no “random error”, factor settings can be assigned a large number of values and reducing bias is the key issue in modeling.
This talk will give a broad background to the field of computer experiments. I will discuss and illustrate ideas for design and for analysis that take advantage of the unique features of these studies. I will describe numerous applications and will present a detailed analysis of a computer simulation of a nuclear waste repository.
The ideas reflect collaboration with many colleagues in statistics and in applied science.
SEQUENTIAL BAYESIAN
DESIGN OF EXPERIMENTS FOR GLM'S
David M. Steinberg
Department of Statistics and Operations Research
Many experiments involve binary or count responses that don't follow a normal distribution. Great advances have been made for modeling the data from these experiments using Generalized Linear Models (GLM's). Knowledge of how to design these experiments efficiently has lagged far behind. For example, classical two-level factorial designs can be very inefficient in binary response experiments. An important, and problematic, aspect is that good designs depend on knowledge of the unknown model parameters. One natural way to resolve this dilemma is to adopt a Bayesian approach and finding designs that are efficient in an average sense with respect to a prior distribution on the model parameters.
I will present some effective, and practical, algorithms for designing
experiments that achieve a high degree of robustness to initial assumptions
about the model parameters. I will
briefly present ideas that can be used in static experiments, in which all runs
are determined at the outset, and will then turn to sequential experiments, in
which the data collected thus far are used in planning subsequent observations.
One algorithm for static experiments
takes advantage of a fast scheme for generating locally optimal designs together
with a clustering procedure. The second
algorithm uses a sophisticated quadrature
approach. The algorithm for the sequential
case uses a sampling and weighting approach, rather than direct computation, to
represent the posterior. I will illustrate
the performance of the algorithms on several applications. For the sequential case, I compare the
results from our algorithm with those from the classic ``Bruceton'' method on
an actual sensitivity test conducted at an industrial plant.
This is joint work with Hovav Dror, Chris Gotwalt and Bradley Jones.
David M. Steinberg is
Professor of Statistics at
Dr. Bradley Jones is Director of
Research & Development in the JMP division of SAS. At JMP he developed the
Custom Designer, a general and powerful tool for generating optimal
experimental designs. Before joining JMP, he was the Chief Statistician at The MathWorks, Inc. where he wrote the Statistics Toolbox for
MATLAB. He was a founding partner of Catalyst Inc. where he created the first
interactive graphical computer tool for the design and analysis of experiments.
He is the inventor of the prediction profile plot - an interactive graph for
exploring multivariate response surfaces. He also holds a patent on the use of
designed experiments for minimizing registration error in multi-layer laminated
circuit boards.